APPARATUSES
Haynes-Shockley experiment
Spectroscopic measurement of Energy Gap in semiconductors
Measurement of resistance vs. temperature for various materials
Rüchardt experiment for measuring Cp/Cv in gases
Wilberforce pendulum
Diffraction and Polarization
Peltier Cell
Hall Effect
Light speed measurements
Electromagnetic gun
the cheapest SPM for AFM, STM and Microlithography
Technical specifications
Images
Scanning Probe Microscope with atomic resolution
for education
Produced by NT-MDT, Russia
Technical specifications
Applications
